Estudo de niveis profundos em semicondutores por transiente de fotocorrente (PITS)

AUTOR(ES)
DATA DE PUBLICAÇÃO

1989

RESUMO

We present a detailed analysis or photocurrent transients in semi-insulating GaAs and we discuss its usefulness as a method for characterization or deep level impurities and defects in high resistivity semiconductors. The photocurrent transient measurements were performed in a "home made" automatic digital system. We present the project details including the hardware and software. This system has the capacity to measure transients in real time with high resolution and fidelity. We summarize the fundamentals of charge carrier emission and capture from deep centers in semiconductors, necessary to analyze the photocurrent transients. We present the differential equations that describes the emission and capture processes with solutions in the first approximation found in the literature. We propose new analytic solutions. in high dark current approximation, that better describe the experimental phenomena. We also present photocurrent transient simulations using numerical solutions of the differential equations with initial conditions very similar to the experimental ones. Both the analytic and numeric solutions presented here, describe equally well the observed photocurrent decay. The high resolution or the measured transients allowed na original and detailed analysis or the photocurrent decay shape. We made a critical analysis or the conventional method or photocurrent transients treatment. based on the so called Photo Induced Transient Spectroscopy (PITS) spectra. In conclusion, we suggest an alternative method for PITS data reduction based on direct analysis of the photocurrent transients, that resulted in more reliable values of activation energy and capture cross section for semi-insulating materials. We present PITS spectra of semi-insulating GaAs in different configurations of polarization, illumination and surface conditions. We characterize the observed traps in the samples, including the activation energies and carrier capture cross sections. We also observed negative peaks in PITS spectra. We present an original interpretation of this phenomenon, based in our analytical and numerical solutions of the differential equation set

ASSUNTO(S)

semicondutores de arsenieto de galio

ACESSO AO ARTIGO

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