Hall effect in InAs/GaAs superlattices with quantum dots: identifying the presence of deep level defects
AUTOR(ES)
Rubinger, R.M., Ribeiro, G.M., Oliveira, A.G. de, Albuquerque, H.A., Silva, R.L. da, Rodrigues, W.N., Moreira, M.V.B.
FONTE
Brazilian Journal of Physics
DATA DE PUBLICAÇÃO
2004-06
RESUMO
We have carried out van der Pauw resistivity and Hall effect measurements on a series of Molecular Beam Epitaxy InAs/GaAs superlattice samples containing InAs quantum dots. Three growth parameters were varied, the InAs coverage, the number of repetitions of the InAs/GaAs layers, and the GaAs spacer thickness. The results can be grouped in two sets, those samples presenting low and high resistivity. The group presenting low resistivity is composed by the samples with GaAs spacer of 30 monolayers (ML) and InAs coverage of 1.9 monolayers. The group presenting high resistivity is composed of samples with GaAs spacer of 40 ML. We claim that the high resistivity characteristic is due to the presence of deep level. Increasing the spacer from 30 to 40 ML decouples the InAs planes favouring the deep level formation.
Documentos Relacionados
- Spin dynamics of electrons and holes in p-doped InAs/GaAs quantum dots
- Anomalous blueshift in vertically coupled InAs/GaAs quantum dots using InGaAs strain-reducing layers
- Influence of annealing on the optical and electrical properties of multilayered InAs/GaAs quantum dots
- Effects of annealing on electrical and optical properties of a multilayer InAs/GaAs quantum dots system
- Difração Bragg-Superfície no estudo de sistemas epitaxiais baseados em pontos quânticos de InAs/GaAs