Diagnostic X Ray Spectrometry
Mostrando 1-5 de 5 artigos, teses e dissertações.
-
1. Implantação de um programa de controle de qualidade em equipamentos de raios x por meio de medidores não invasivos / Establishment of an X radiation equipment quality control programme using non invasive meters
The objective of this work was to study the behavior of the mainly X ray equipment calibration laboratory of IPEN, operated in the range from 25 kV to 150 kV using a PTW non invasive meter, model DiavoltTM, and an ORTEC spectrometry system, model NOMAD-PLUS 92X, for the establishment of a quality control programme. The Diavolt meter was used for measurements
IBICT - Instituto Brasileiro de Informação em Ciência e Tecnologia. Publicado em: 14/09/2010
-
2. X-ray beam qualities for dental radiology purposes / PadronizaÃÃo de qualidade de feixes de raios-X para uso em radiologia odontolÃgica
In order to establish characteristics or properties of equipment for diagnostic radiology, e.g. ion chambers and semiconductor detectors, calibration laboratories offer a set of well-defined radiation conditions, called X-ray qualities, which can be used for many Physics studies and medical purposes. These X-ray qualities can be determined in terms of: (a) X
Publicado em: 2009
-
3. X-ray beam qualities for dental radiology purposes / PadronizaÃÃo de qualidade de feixes de raios-X para uso em radiologia odontolÃgica
In order to establish characteristics or properties of equipment for diagnostic radiology, e.g. ion chambers and semiconductor detectors, calibration laboratories offer a set of well-defined radiation conditions, called X-ray qualities, which can be used for many Physics studies and medical purposes. These X-ray qualities can be determined in terms of: (a) X
Publicado em: 2009
-
4. Characterization of cadmium and zinc telluride (CZT) and pin type silicon (Si-Pin) photodiode detectors for x-ray spectrometry / Characterization of cadmium and zinc telluride (CZT) and pin type silicon (Si-Pin) photodiode detectors for x-ray spectrometry / CaracterizaÃÃo dos detectores de telureto de cÃdmio e zinco (CZT) e fotodiodo de silÃcio tipo pin (Si-PIN) para a espectrometria de raios-x / CaracterizaÃÃo dos detectores de telureto de cÃdmio e zinco (CZT) e fotodiodo de silÃcio tipo pin (Si-PIN) para a espectrometria de raios-x
A detailed understanding of X-ray spectrum is essential for analyzing equipment that emits this kind of radiation in radiodiagnostic facilities. Information on the various parameters that are contained in this spectrum is important for quality control of X-ray equipment. Spectrometry of X-ray beams uses very often GeHP detectors, that have good detection eff
Publicado em: 2008
-
5. Characterization of NPN-phototransistor for x-ray diagnostic spectrometry / CaracterizaÃÃo de fototransistor NPN para espectrometria de raios-x diagnÃstico
Este trabalho apresenta um estudo inicial a respeito da utilizaÃÃo de fototransistores bipolares de junÃÃo como dispositivo de mediÃÃo de energias de fÃtons de raios-X na faixa de diagnÃstico. O fototransistor à analisado a partir da resposta da corrente de coletor em funÃÃo da corrente de base durante a irradiaÃÃo do dispositivo com fÃtons de
Publicado em: 2007